Research Institute for Electronic Science, Hokkaido University


LAST UPDATE 2017/02/25

  • 研究者氏名
    Researcher Name

    西野吉則 Yoshinori NISHINO
    教授 Professor
  • 所属
    Professional Affiliation

    Research Institute for Electronic Science, Hokkaido University

    Laboratory of Coherent X-ray Optics, Section of Photonics and Optical Science
  • 研究キーワード
    Research Keywords

    Coherent X-rays
    Synchrotron radiation (SR)
    X-ray free-electron laser (XFEL)
    Phase-contrast imaging
Research Subject
コヒーレント X 線を用いた物質深部のナノ構造解析
Analysis of nanostructures deep inside materials using coherent X-rays

研究の背景 Background


Traditionally, x-ray diffraction has been powerfully used in atomic structure determination for crystalline samples. Coherent x-rays diffraction further opens up a new avenue for high-resolution structure analysis even for non-crystalline sample, such as cells or organelles. X-ray free-electron lasers with femtosecond pulse duration for the first time provide an opportunity to solve the radiation damage problem in high-resolution biological imaging, and enable us to take snapshots of biological samples under natural conditions.

研究の目標 Outcome


We take advantage of the coherence of synchrotron radiation (SR) and X-ray free-electron laser (XFEL) to develop new imaging techniques in a wide length scale ranging from macroscopic to atomic. We have been performing coherent X-ray imaging research to understand macroscopic properties from atomic-/nano-level, which will definitely lead to breakthroughs in a variety of scientific fields including both life and materials sciences.

研究図Research Figure

Fig.1. Single-shot live cell imaging revealing internal nanostructures by pulsed coherent X-ray solution scattering (PCXSS) using XFEL. Fig.2. Human mitotic chromosomes consist predominantly of irregularly folded nucleosome fibers without a 30-nm chromatin structure revealed using SR. Fig.3. Ultrafast structure dynamics of metal-to-insulator transition in VO2 nanowire by time-resolved coherent Xray diffraction using XFEL.

文献 / Publications

Nature Commum., 5, 3052 (2014). Nano Lett., 14, 2413(2014). Opt. Express, 21, 9267 (2013). Curr. Opin. Struct. Biol., 22, 670 (2012). EMBO J., 31, 1644 (2012). Appl. Phys. Express, 3, 102701 (2010). Nature Phys., 6, 122 (2010). Phys. Rev. Lett., 102, 018101 (2009). Proc. Natl. Acad. Sci. USA, 100, 110 (2003).