Institute of Multidisciplinary Research for Advanced Materials, Tohoku University


LAST UPDATE 2021/05/04

  • 研究者氏名
    Researcher Name

    宮田智衆 Tomohiro MIYATA
    助教 Assistant Professor
  • 所属
    Professional Affiliation

    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

    計測研究部門 高分子物理学研究分野
    Division of Measurements, Polymer Physics and Chemistry
  • 研究キーワード
    Research Keywords

    Transmission Electron Microscopy
    Single Atom
Research Subject
Atomic-resolution analysis of organic materials using transmission electron microscopy

研究の背景 Background


Polymeric materials are widely used owing to their lightness and flexibility. However, the conformation of individual polymer chains, entanglement structure of polymer chains and adsorption structures between polymers and inorganic materials, determining the materials properties, have not been revealed due to the lack of atomic/molecular-scale observation methods. Thus, new methods to observe and analyze polymeric materials at atomic resolution are desired.

研究の目標 Outcome


Scanning transmission electron microscopy (STEM) is available for direct observation of atomic positions and nanostructures in materials. In addition, use of differential phase contrast method and electron energy-loss spectroscopy with STEM enables us to observe local electric field and chemical bonding states. My research aims to apply these methods to polymer observation and reveal the conformation and adsorption structures of polymer chains at atomic scale.

研究図Research Figure

Fig.1. Schematic of the STEM system. A convergent electron beam is scanned on a sample, and transmitted electrons are detected with several detection angles.

Fig.2. Schematic of a chemically modified polymer chain with heavy atoms.

Fig.3. ADF-STEM image of a modified polymer chain with heavy atoms. The bright spots are corresponding to the respective heavy atoms.

文献 / Publications

化学工業, 69, 727-734 (2018).  Science Advances, 3, e1701546 (2017).  Ultramicroscopy, 178, 81-87 (2017).  Microscopy, 67, i162-i167 (2018).  Microscopy 63, 377-382 (2014).