Institute of Multidisciplinary Research for Advanced Materials, Tohoku University


LAST UPDATE 2021/05/06

  • 研究者氏名
    Researcher Name

    佐藤庸平 Yohei SATO
    准教授 Associate Professor
  • 所属
    Professional Affiliation

    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

    計測研究部門 電子回折・分光計測研究分野
    Division of Measurements, Electron-Crystallography and-Spectroscopy
  • 研究キーワード
    Research Keywords

    Electron energy-loss spectroscopy
    Transmission electron microscopy
    Analysis for optical/dielectric properties of nano-scale materials
Research Subject
Analysis for dielectric properties of nano-scale materials using nm electron probe

研究の背景 Background


Electron energy-loss spectroscopy (EELS) based on transmission electron microscopy (TEM) reveals the optical/dielectronic properties and the unoccupied electronic states of materials. This analytical technique enables to reveal optical/dielectric properties of individual nanomaterials or single phase area of new functional materials including impurities.

研究の目標 Outcome


The functional nano-particles, which have various optical properties different from bulk materials, are applied for optical scattering filters and high efficient luminescence materials, etc. We research origins of the characteristic properties or electronic structures of the functional nanoparticles by conducting TEM-EELS measurements for the purpose of developing the materials improved such functions.

研究図Research Figure

Fig.1. EELS spectra obtained from a Cs0.33WO3 nanoparticle, which is applied for a NIR scattering filter (left). ADF-STEM image of Cs0.33WO3 nanoparticle (right). A peak at ~0.8 eV of spectrum A correspond to the dipole oscillation, which is the origin of NIR scattering property. The peak position is sensitive for particle’s surface condition, for example deficiency of Cs atoms. Fig.2. Experimental EELS spectrum (upper) and simulation (lower) of a multi-shell nanoparticle, which is applied for photo luminescent devices. Spectral structures in lower energy region (surrounding red dotted line) reflect the individual core and shell’s dielectric properties.

文献 / Publications

Microsc. Microanal. 20 (2014) 807–814., J. Phys. Conf. Ser. 500 (2014) 192013, J. Appl. Phys. 112 (2012) 074308, Diamond & Related Materials, 25 (2012) 40–44, Ultramicroscopy, 111 (2011) 1381–1387.