Institute of Multidisciplinary Research for Advanced Materials, Tohoku University


LAST UPDATE 2021/05/05

  • 研究者氏名
    Researcher Name

    矢代航 Wataru YASHIRO
    教授 Professor
  • 所属
    Professional Affiliation

    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

    計測研究部門 量子フロンティア計測研究分野
    Division of Measurements, Frontier quantum-beam metrology
  • 研究キーワード
    Research Keywords

    X-ray optics
    Phase measurement
    Structure analysis
Research Subject
Development of new methods using phases of X-rays and neutrons

研究の背景 Background


Quantum beams represented by X-rays and neutrons have been widely used to visualize internal structures in materials. Recently, advanced techniques (for example, with high sensitivities and multidimensionalities) using phases of X-rays and neutrons have been developed and attracted increasing attentions in many fields including engineering, material, biological, and medical sciences.

研究の目標 Outcome


We are developing unprecedented advanced imaging and structure-analysis methods (including microscopies) using phases of X-rays and neutrons. Our research includes theoretical and experimental understandings of physical phenomena, designs and fabrications of new X-ray and neutron optics, and explorations of new scientific seeds through the applications of the developed methods.

研究図Research Figure

Fig.1. Modulation of the intensity of CTR scattering caused by a Bragg reflection, from which it has been revealed that there are long-range and small strain fields beneath SiO2/Si interfaces. Fig.2. X-ray phase-difference microscopy using a single phase grating, making it possible to realize quantitative X-ray imaging with a high sensitivity and a high spatial resolution. Fig.3. Ultra-small-angle X-ray scattering (USAXS) imaging (tomography), in which quantitative structure analysis of unresolvable microstructures can be realized for each pixel (voxel).

文献 / Publications

Appl. Phys. Exp. 7, (2014) 032501. Phys. Rev. B 84, (2011) 094106. Opt. Express 18, (2010),16890. Phys. Rev. A 82, (2010) 043822. Phys. Rev. Lett. 103, (2009) 180801. J. Opt. Soc. Am. A 25, (2008) 2025. Surf. Sci. 550, (2004) 93. Phys. Rev. B 72, (2005) 121407. Surf. Sci. 490, (2001) 394.